Nx Rev Inc

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Independent Laboratory specializing in Analysis of

Semiconductor and Electronic Devices since 1982



Failure Analysis & Characterization of:



* Semiconductor Devices

* Passive Electronic Components

* Printed Circuit Boards (PCB)

* Micro Electro Mechanical Systems (MEMS)

* Fiber Optic Components

* Optoelectronic Devices

* Solar Cells

* Hybrid assemblies

* Flat Panel Displays

* Bioelectronic Materials & Components

* Image Sensors



Services:



* SPICE Modeling Service

* SPICE Models Extractions and Validations

* Statistical SPICE Models Extractions and Validations

* Existing SPICE Models Quality Check and Correction

* Process Design Kits SPICE Models Quality Check and Correction

* Circuit SPICE simulations

* Scanning Capacitance Microscopy (SCM)

* Metallurgical Failure Analysis

* Package Decapsulation

* Cross-Sectioning

* Parallel and Angle Lapping

* Sequential Stripback

* Destructive Physical Analysis (DPA)

* Optical Microscopy

* X-ray Radiography

* Scanning Electron Microscopy (SEM)

* Emission Microscopy

* X-ray Energy Dispersive Spectroscopy (XED)

* Auger Electron Spectroscopy (AES)

* Secondary Ion Mass Spectroscopy (SIMS)

* Atomic Force Microscopy (AFM)

* Focused Ion Beam (FIB)

* Electrical Failure Analysis

* Electrical characterization

* Voltage Contrast

* Optical Beam Induced Current (OBIC)

* Electron Beam Induced Current (EBIC)

* Electrostatic Discharge Sensitivity Test (ESD)

* Latchup Evaluation

* Focused Ion Beam (FIB) Circuit Modification

* FIB Electrical Troubleshooting

* Dielectric Integrity Tests

* Hot Spot Detection

* Intellectual Property (IP) technical consulting

* Patent litigation technical consulting

* MIL-STD Certifications